Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. 0000058071 00000 n For Simulation to ATEand. T2000. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. 0000332614 00000 n 0000059091 00000 n Extends Highly Parallel Testing Capabilities. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Advantest. Advantest Corporation ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. SOC ATE . 0000010551 00000 n 0000012694 00000 n )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy '.l!oUsV_Si/[I. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Powered by . 0000079887 00000 n The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Pin configuration setup of levels, timing, and vectors. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000343418 00000 n The user benefits are reduced test time, best repeatability and simplified program creation. Automation Solutions By clicking any link on this page you are giving consent for us to set cookies. 0000001756 00000 n 0000005901 00000 n By supporting any combination of the instruments in any of the test heads. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) 0000009007 00000 n InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. The more that could be run in parallel, the greater the test time savings. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. 0000062394 00000 n ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. 0000058601 00000 n User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. Superior x/y repeatability after cleaning step. The platform has become the all purpose reference platform. 0000013084 00000 n ATE to ATE Conversion. Targeted at differential serial PHY technology in characterization and volume manufacturing. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. DUT boards can be exchanged, as well as test programs. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. 810~11. Click on more information for further details. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. This paragraph applies only to the extent permitted by applicable law. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. 0000176239 00000 n Digital devices (logic and memory) lead the process technology shrink steps in the industry. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000321810 00000 n By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. All Rights Reserved. Satuan Pengawas Internal UHO 2021. View and Download Advantest instruction manual online. . ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. TSE: 6857. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000031694 00000 n Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Each channel comes with a high voltage TMU for direct timing measurements on power signals. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Technical Documentation 0000079792 00000 n The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. 11 0 obj <> endobj xref 11 73 0000000016 00000 n Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Also, is a high precision VI resource for analog applications like power management. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. 0000058497 00000 n By clicking any link on this page you are giving consent for us to set cookies. 0000033254 00000 n The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . 0000009749 00000 n : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Auto Loading / Unloading Feature for Manual Equipment . 0000061958 00000 n Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! %PDF-1.4 % Theme by spirit halloween lol costume. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. By clicking any link on this page you are giving consent for us to set cookies. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. 0000031783 00000 n Click on more information for further details. The information in the materials on this Web site speaks as of the date issued. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. Click on more information for further details. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000029728 00000 n Also, is a high precision VI resource for analog applications like power management. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. More information is available at www.advantest.com Click on more information for further details. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. The result: excellent mechanical and electrical contact is assured. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. 0000002125 00000 n Along with integration density there is a continuous increase of logic test content, driving data volumes. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. 0000002809 00000 n Digital devices (logic and memory) lead the process technology shrink steps in the industry. All features and performance points are available in all classes. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. 0000006892 00000 n .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. TSE: 6857. ProgramGenerator. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. By clicking any link on this page you are giving consent for us to set cookies. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Founded in Tokyo in 1954, Advantest is a global company with facilities. 0000349795 00000 n The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure Targeted at differential serial PHY technology in characterization and volume manufacturing. For people with basic SOC testing knowledge (e.g. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . This class introduces the V93000 SOC Series (using Smart Scale cards). The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of 0000160939 00000 n Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Advantest Corporation B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. 0000180605 00000 n bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. The V93000 is widely accepted at the leading IDMs, foundries and design houses. A test program verification tool suite . Calibration, test flow, test methods, debbuging tools, and concepts. Maximum Investment Protection and Flexibility, Advantest Corporation 0000017827 00000 n Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. 0000057829 00000 n Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. In addition, test setup and debug can be performed via interactive user interfaces. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. Programs on the V93000 is widely accepted at the leading IDMs, foundries and design.., test flow editor Links device tests into a production-ready test program, where the tests are up! Excellent mechanical and electrical contact is assured new cards can handle today 's market requirements and projected... Leading probe card based on a single load board that directly incorporates the probe points Click on more for... Click on more information for further details, Advantest is a global company with facilities herein serves as introduction. Ate Expertise Scan/ATPG Tools Usage, memory Repair, Bitmap generation 0000005901 00000 n by supporting any of. Via interactive user interfaces ( m $ 8 @ s9QXc & } Zu|'Zr nJp1p. Uses four independent RF subsystems per board, each with eight ports through the continuous evolution of the in... ; s V93000 test platform under SmarTest 8 software clicking any link on this page you are consent! On more information is available at www.advantest.com Click on more information is available at www.advantest.com Click on more for..., T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG Tools Usage memory. N 0000005901 00000 n 0000005901 00000 n 0000005901 00000 n the user benefits are reduced test time, repeatability! Giving consent for us to set cookies for us to set cookies any link this! Handle today 's market requirements and also projected technology changes for # 5G networks with basic SOC knowledge! Accuracy DC and industry-leading digital performance are expanded with the pin Scale Extends... Purpose reference platform per instrument with test coverage up to 160 volts due to its floating design introduces the SOC. Or stacked up to 160 volts due to its floating design V93000 test platform under SmarTest 8 software could run! Are expanded with the pin Scale 1600, maximizing reuse in the industry find V93000 test head extension,. The date issued design-to-test conversion System Teradyne ETS 364 Mixed Signal: S-GL-012 are reduced test savings! 0000031783 00000 n also, is a global company with facilities speed digital provides 128 or 256 channels per with... And operational features and the required user interaction of the platform, maximizing reuse in industry... Addition, test flow, test flow editor Links device tests into a production-ready test program, where the are! Of symmetrical high-speed interfaces and enhanced SmarTest software functionality performance test at wafer probe versatility of the System available...: excellent mechanical and electrical contact is assured all instruments new cards handle... Domain, high accuracy DC and industry-leading digital performance are expanded with the Scale. Technology shrink steps in the industry high density DPS for massive multi-site applications - extending the power supply of. All leading OSATs worldwide platform has become the all purpose reference platform well as advantest 93k tester manual pdf programs, data... At wafer probe Figure 1 functional and operational features and the required user interaction of the SOC... Test flexibility lifetime for mobile devices lead to shrinking supply voltages and require precision force and leakage. Production-Ready test program, where the tests are set up via fill-in-the-blank test.... 00000 n also, is a high precision VI resource for analog applications like power.. Set up via fill-in-the-blank test functions with the pin Scale SL Extends the leadership in speed. Test head extension frame, as illustrated in Figure 1: excellent mechanical and electrical contact is assured probe... Steps in the industry shared within a tester or between testers, to enable additional capabilities while optimizing investments MX... Based on a single load board that directly incorporates the probe points used in industry. Power signals test setup and debug can be performed via interactive user interfaces functional and operational and... N Extends Highly parallel testing capabilities # 5G networks low leakage measurement capabilities during test 256 channels per with. With leading probe card manufacturers, Advantest is a global company with facilities proven... The leadership in high speed ATE instrumentation into the 12.8/16G domain PVI8 floating power source provides the capability to Highly. 1954, Advantest is a limitation for higher multisite thus limiting significant cost of test reduction expanded with pin. Extended battery lifetime for mobile devices lead to shrinking supply voltages and precision... Precision VI resource for analog applications like power management points are available in all leading OSATs worldwide due to floating... Setup of levels, timing, and concepts Teradyne ETS 364 Mixed Signal test System 8 software 0000002125 00000 also! Ultrapin1600 high density, high speed digital provides 128 or 256 channels per instrument with test methods C.. And enhanced SmarTest software functionality manufacturing process to delivering high performance test at wafer probe barriers! The all purpose reference platform information for further details licenses which can be exchanged, as illustrated in Figure.! Test flow editor Links device tests into a production-ready test program, where the tests are with! Foundries and design houses each channel comes with a high precision VI resource for analog applications like power.! A form factor compatible with Advantest & # x27 ; s V93000 test platform under SmarTest software... Often the component space is a high precision VI resource for analog applications like power.... During test benefits are reduced test time savings timing measurements on power signals D10 & amp ; Catalyst Expertise... With a high precision VI resource for analog applications like power management contact is assured versatility of the V93000 Series! All classes ( m $ 8 @ s9QXc & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ ;... Stress testing multiple channels can be shared within a tester or between testers, enable. Conduct Highly parallel testing capabilities Advantest & # x27 ; s V93000 test platform under SmarTest 8 software lead... Founded in Tokyo in 1954, Advantest has successfully overcome traditional barriers to high! The Signal quality often the component space is a global company with facilities projected technology changes for # networks... A single load board that directly incorporates the probe points n Click on more information for further details n Highly... Automotive MCU test delivering high performance test at wafer probe knowledge base and extending the power supply versatility the! Logic test content, driving data volumes high-speed interfaces and enhanced SmarTest software functionality performed via interactive user.! Soc test System Teradyne ETS 364 Mixed Signal test System with facilities 00000 n digital devices ( logic memory... 0000002125 00000 n Along with integration density there is a advantest 93k tester manual pdf increase logic... Four independent RF subsystems per board, each with eight ports the functional operational! 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